Semiconductor device manufacturing: process – Repair or restoration
Reexamination Certificate
2006-03-28
2008-11-11
Smoot, Stephen W (Department: 2813)
Semiconductor device manufacturing: process
Repair or restoration
C438S073000, C438S149000, C438S940000, C257SE21475
Reexamination Certificate
active
07449347
ABSTRACT:
A repairing method of thin film transistor array is provided. The repairing method of thin film transistor array can remove a residue between pixel electrodes so as to prevent the residue from electrically connecting pixel electrodes adjacent to each other. The repairing method of thin film transistor array can also be provided to remove a portion of the pixel electrodes above a particle or a defect, which may cause leakage of a storage capacity. The parameters of repairing method of the thin film transistor array precisely controlled and the yield of the thin film transistor array can be effectively improved.
REFERENCES:
patent: 5518956 (1996-05-01), Liu et al.
patent: 6856374 (2005-02-01), Ozaki et al.
patent: 7209194 (2007-04-01), Suzuki et al.
patent: 2004/0179147 (2004-09-01), Kiya et al.
AU Optronics Corporation
Jianq Chyun IP Office
Smoot Stephen W
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