Repairable multi-level overlay system for semiconductor device

Electricity: conductors and insulators – Feedthrough or bushing – Compression

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

357 81, 357 74, 357 75, 174 685, 361395, 361397, 361414, H01L 2712

Patent

active

045492000

ABSTRACT:
A multi-level integrated circuit packaging system having a primary support frame, an array of secondary support frames mounted in said primary support frame and an array of single chip carriers associated with each secondary support frame. An integrated circuit is encapsulated in each single chip carrier, which may be a variety of carrier types which has an insulated wiring pattern with EC wells and delete lands. The secondary and primary support frames also have EC pads so that a change capability exists to any electrical signal path terminating on the chip.

REFERENCES:
patent: 3777221 (1973-12-01), Tatusko et al.
patent: 4069498 (1978-01-01), Joshi
patent: 4225900 (1980-09-01), Ciccio et al.
patent: 4254445 (1981-03-01), Ho
patent: 4288841 (1981-09-01), Gogal
patent: 4322778 (1982-03-01), Barbour et al.
patent: 4423468 (1983-12-01), Gatto et al.
patent: 4472762 (1984-09-01), Spinelli et al.
Ecker et al., IBM TDB, vol. 22, No. 11, Apr. 80, p. 4852, "Low Profile . . . Means".

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Repairable multi-level overlay system for semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Repairable multi-level overlay system for semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Repairable multi-level overlay system for semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-124962

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.