Remote temperature measuring system with semiconductor junction

Details Remote temperature measuring system with semiconductor junction Remote temperature measuring system with semiconductor junction

1979-06-04

1980-10-21

Myracle, Jerry W.

Measuring and testing

Gas analysis

Moisture content or vapor pressure

G01K 710

Patent

active

042286840

ABSTRACT:
A circuit is provided for measuring the effect of temperature on the voltage drop across the semiconductor junction sensor which is located remotely from the measuring circuit and connected thereto by a pair of conductors having substantial lead resistance. The circuit provides a programmed current source which alternately provides to the sensor first and second currents of different magnitudes having a fixed ratio to produce corresponding voltages across the conductors wherein each voltage includes a lead component arising from the lead resistance and the respective current. A sample and hold circuit measures each of the voltages and an amplifier multiplies one of the voltages by the current ratio and the resultant voltages are compared to obtain an output free of any lead component and which varies with the temperature of the sensor.

REFERENCES:
patent: 3430077 (1969-02-01), Bargen
patent: 3812717 (1974-05-01), Miller et al.

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