Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2006-05-09
2008-07-15
Toatley, Jr., Gregory J (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
C356S438000
Reexamination Certificate
active
07400398
ABSTRACT:
A system and method for correcting for “wavelength drift” in an RES system. One advantage provided by the invention includes the ability to correct for offset amounts of “wavelength drift” that are not divisible by an integer number of pixels (e.g., fraction pixel offset amounts) in an optical detector used in the RES system. Correction of fractional pixel offset amounts may enhance spectral matching, enable substantially continuous calibration of an RES system, and/or other benefits.
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Snider, D.; Shanks, R.; Cole, R.; Hudson, M.K.; “Inexpensive photodiode arrays for use in rocket plume and hot source monitoring and diagnostics”; 2003, Measurement Science and Technology, vol. 14, p. 1725-1733.
Environmental Systems Products Holdings Inc.
Giglio Bryan
Pillsbury Winthrop Shaw & Pittman LLP
Toatley Jr. Gregory J
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