Reliability qualification vehicle for application specific integ

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257203, 3074651, G01R 3128, H01L 2708

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active

052992047

ABSTRACT:
Reliability qualification vehicles are described with internally generated clock and control signals which may be selected in place of externally generated signals for exercising the vehicle. If implemented in gate-arrays, the vehicle may be contained in different sized packages to test the effects of different size packaging on the vehicle. Substantially all the gates of the vehicle are testable. The vehicle may be operated synchronously and its design enables quick feedback and analysis of faulty portions of a cell library or place and route scheme.

REFERENCES:
patent: 3921142 (1975-11-01), Bryant et al.
patent: 4458165 (1984-07-01), Jackson
patent: 4593205 (1986-06-01), Bass et al.
patent: 4688072 (1987-08-01), Heath et al.
patent: 4724531 (1988-02-01), Angleton et al.
patent: 4733288 (1988-03-01), Sato
patent: 4864381 (1989-09-01), Seefeldt et al.
patent: 4931722 (1990-06-01), Stoica
patent: 4949341 (1990-08-01), Lopez et al.
Sechenr, C. et al., "The Timberwolf Placement and Routing Package", IEEE J. Solid-State Circuits, vol. SC-20, No. 2, Apr. 1985, pp. 510-522.
Baran, D. et al., "HC2000: A Fast Gate Array with Built-In Self Test and System Fault Isolation . . . ", IEEE Custom IC Conf., May 1986, pp. 315-318.
Rasmussen, R. et al., "Advanced Testing Techniques for Structured ASIC Products", IEEE Custom IC Conf., May 1986, pp. 412-415.
"Functional cells support 16-bit CPU to create alterable microcomputer", by H. Lyle Supp, American Microsystems, Inc., a subsidiary of Gould, Inc., Santa, Clara, Calif., Electronics, Sep. 22, 1982, pp. 151-153.
"Pseudo-Exhaustive Adjacency Testing: A BIST Approach for Stuck-Open Faults," by Gary L. Craig and Charles R. Kime, Dept. of Electrical and Computer Eng. Univ. of Wisconsin-Madison, paper 3.6, 1985 Int'l Test Conference, 126-137.
"LOCST: A Built-In Self-Test Technique" by Johnny J. LeBlanc, IBM Federal Systems Division, IEEE Design & Test, Nov. 1984, pp. 45-52.
"Testing for MOS IC Failure Modes" by David G. Edwards, Senior Member IEEE, Siemens Corporation, Cherry Hill, IEEE Transactions on Reliability, vol. R-31, No. 1, Apr. 1982, pp. 9-17.
"Fundamentals of Testability--A Tutorial" by Ronald R. Fritzemeier, Member, IEEE, H. Troy Nagle, Fellow, IEEE, and Charles F. Hawkins, Member, IEEE, IEEE Transactions on Industrial Electronics, vol. 36, No. 2, May 1989, pp. 117-128.
"Microprocessor Testability" by H. Troy Nagle, Fellow, IEEE, Ronald R. Fritzemeier, Member, IEEE, Jean E. Van Well & Michael G. McNamer, IEEE Transactions on Industrial Electronics, vol. 36, No. 2 May 1989, pp. 151-163.
"Reconfigurable Hardware for Pseudo-Exhaustive Test", by Jon G. Udell Jr., Ctr. for Reliable Computing Depts. of Electrical Eng. and Computer Science--Stanford University, 1988 Int'l Test Conference, Paper 27.3, PP. 522-530.

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