Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-08-15
2006-08-15
Nguyen, Vinh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010, C324S754090
Reexamination Certificate
active
07091733
ABSTRACT:
A reliability evaluation test apparatus of this invention includes a wafer storage section which stores a wafer in a state wherein the electrode pads of a number of devices formed on the wafer and the bumps of a contactor are totally in electrical contact with each other. The wafer storage section transmits/receives a test signal to/from a measurement section and has a hermetic and heat insulating structure. The wafer storage section has a pressure mechanism which presses the contactor and a heating mechanism which directly heats the wafer totally in contact with the contactor to a predetermined high temperature. The reliability of an interconnection film and insulating film formed on the semiconductor wafer are evaluated under an accelerated condition.
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Hagihara Junichi
Hatsushika Kunihiko
Hayasaka Nobuo
Hosaka Hisatomi
Ido Yoshiyuki
Ibiden Co. Ltd.
Kabushiki Kaisha Toshiba
Nguyen Jimmy
Nguyen Vinh
Tokyo Electron Limited
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