Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-01-04
2011-01-04
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S189000, C702S191000
Reexamination Certificate
active
07865322
ABSTRACT:
Relative noise is a single scalar value that is used to predict the maximum value of the expected noise at any point and is calculated from the measured signal and a mathematical noise model. The mathematical noise model is selected or estimated from an observation that includes statistical and/or numerical modeling based on a population of measurement points. An absolute noise for a plurality of points of the measured signal is estimated. An array of values is calculated by dividing each of a plurality of points of the absolute noise by a corresponding expected noise value calculated from the mathematical noise model. The relative noise is calculated by taking a standard deviation of a plurality of points of the array. The relative noise can be used to calculate scaled background signal noise, filter regions, denoise data, detect false positives from features, calculate S/N, and determine a stop condition for acquiring data.
REFERENCES:
patent: 4628529 (1986-12-01), Borth et al.
patent: 7340375 (2008-03-01), Patenaud et al.
patent: 2004/0215396 (2004-10-01), Christie et al.
patent: 2006/0144126 (2006-07-01), O'Brien et al.
patent: 2008/0059072 (2008-03-01), Willen et al.
Bonner Ronald
Ivosev Gordana
Yang Min
Bui Bryan
DH Technologies Development PTE. Ltd.
Kasha John R.
Kasha Law LLC
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