Optics: measuring and testing – Angle measuring or angular axial alignment – Apex of angle at observing or detecting station
Patent
1994-04-19
1996-07-30
Tarcza, Thomas H.
Optics: measuring and testing
Angle measuring or angular axial alignment
Apex of angle at observing or detecting station
G01B 1126, G01C 100
Patent
active
055417264
ABSTRACT:
A measuring section of a target tracer emits emergent light from a light source toward a reflector of a target by way of a half mirror of an optical system. The reflector has a light reflection factor increasing toward the center thereof and has areas of respective reflection factors arranged concentrically. Reflected light from the reflector passes through the mirror and is introduced to an imaging element. The imaging element scans a two-dimensional image of the reflector to generate electric signals composed of a plurality of corresponding picture elements. A threshold value comparing circuit selects those of the electric signals which are higher than a threshold value as azimuth signals. An angle calculating circuit calculates the center of the image of the reflector from the azimuth signals and calculates an azimuth angle and an elevation angle of the target with respect to the measuring section from a displacement of the center of the image from the center of a field of view of the imaging element. A threshold value controlling circuit increases the threshold value when the number of picture element of the azimuth signals is greater than a predetermined value, but decreases the threshold value when the number of picture elements of the azimuth signals is smaller than the predetermined value.
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Laufer Pinchus M.
NEC Corporation
Tarcza Thomas H.
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