Regular array of microscopic structures on a substrate and...

Semiconductor device manufacturing: process – Gettering of substrate – By implanting or irradiating

Reexamination Certificate

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C438S798000

Reexamination Certificate

active

07008862

ABSTRACT:
A regular array and method of forming a substantially regular array of microscopic structures on a surface of a sample is described. A device of the present invention comprises a microscopic layer of at least one first material on a substrate of a second material, wherein the microscopic layer is sufficiently thin that stress fields at the interface of the microscopic layer and the substrate cause formation of separated regions of the first material on the substrate. The microscopic layer on the sample is irradiated by means of a particle beam at an acute angle to influence the direction of alignment of the separated regions and/or the relative position of adjacent the separated regions.

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Batzill, M., et al., “Preferential Sputtering Induced Stress Domains and Mesoscopic Phase Separation on CaF2(111),”Physical Review Letters, vol. 85, No. 4, pp. 780-783, (Jul . 24, 2000).
Facsko, S., et al.; “Formation of Ordered Nanoscale Semiconductor Dots by Ion Sputtering,”Science, vol. 285, pp. 1551-1553, (Sep. 3, 1999).
Wissing, M., et al., “An Apparatus for Glancing Incidence Ion Beam Polishing and Characterization of Surfaces to Angstrom-Scale Root-Mean-Square Roughness,”Rev. Sci. Instrum., vol. 67, No. 12, pp. 4314-4320, (Dec. 1996).

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