Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-01-18
2011-01-18
Werner, Brian P (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
Reexamination Certificate
active
07873206
ABSTRACT:
A registration detection system performing registration-detecting each substrate in a lot without lowering an original throughput of a lithography system and maintaining high accuracy usable for the correction of an exposure process. Therefore, registration detection5system includes: the first detection apparatus installed on a pathway to a collection in a transport container of substrates taken out of transport container, after passing at least exposure process and a development process, registration-detects substrates after passing development process, according to stipulated criteria, and outputs results of registration detection for use in correction of exposure process; the second detection apparatus outside10the pathway, and registration-detecting substrate when substrate after passing the first detection apparatus and collected in the transport container is taken out of transport container again; and a correction unit comparing detection results by the first and the second detection apparatuses to correct registration detection criteria in the first detection apparatus.
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Arent & Fox LLP
Nikon Corporation
Werner Brian P
LandOfFree
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