Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-10-16
2007-10-16
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S072500, C324S522000
Reexamination Certificate
active
11338274
ABSTRACT:
A probe apparatus has first and second access ports and a measurement port. The first and second access ports are adapted to be interposed in a test circuit. A voltage amplifier and a voltage splitter are adapted to present the second access port and the measurement port each with a voltage representative of a voltage received by the first access port.
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patent: 5460028 (1995-10-01), Werner et al.
patent: 6160408 (2000-12-01), Fenton
patent: 6909272 (2005-06-01), Bengtsson
patent: 7083423 (2006-08-01), Guerra et al.
Holcombe Brent A.
LaMeres Brock J.
Logelin Donald M.
Wood Glenn
Bouscaren June L.
Chan Emily Y
Nguyen Ha Tran
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