Refractometer with deflecting element

Optics: measuring and testing – Refraction testing

Patent

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Details

351205, G01N 2141, G02C 104

Patent

active

058867805

ABSTRACT:
A refractometer comprising an optical pattern-beam projection system for projecting a pattern,light beam onto the fundus of a tested eye to measure refractive power of the tested eye, and an optical light-receiving system for receiving the pattern light beam reflected at the fundus to compute the refractive power of the tested eye. A deflecting member is inserted into an optical path of the optical pattern-beam projection system for deflecting the pattern light beam with respect to an optical axis of the optical pattern-beam projection system and then projecting the deflected pattern light beam onto the fundus.

REFERENCES:
patent: 4544248 (1985-10-01), Nunokawa
patent: 4761070 (1988-08-01), Fukuma

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