Optics: measuring and testing – Refraction testing
Patent
1997-07-02
1999-03-23
Kim, Robert
Optics: measuring and testing
Refraction testing
351205, G01N 2141, G02C 104
Patent
active
058867805
ABSTRACT:
A refractometer comprising an optical pattern-beam projection system for projecting a pattern,light beam onto the fundus of a tested eye to measure refractive power of the tested eye, and an optical light-receiving system for receiving the pattern light beam reflected at the fundus to compute the refractive power of the tested eye. A deflecting member is inserted into an optical path of the optical pattern-beam projection system for deflecting the pattern light beam with respect to an optical axis of the optical pattern-beam projection system and then projecting the deflected pattern light beam onto the fundus.
REFERENCES:
patent: 4544248 (1985-10-01), Nunokawa
patent: 4761070 (1988-08-01), Fukuma
Fukuma Yasufumi
Hayashi Takefumi
Tamura Kazuhiko
Kabushiki Kaisha Topcon
Kim Robert
Merlino Amanda
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