Refractively scanned interferometer

Details Refractively scanned interferometer Refractively scanned interferometer

1977-04-25

1980-02-26

Clark, Conrad J.

Optics: measuring and testing

By particle light scattering

With photocell detection

250237G, 356374, G01B 902

Patent

active

041903668

ABSTRACT:
An interferometer, preferably of the Michelson type, is disclosed, in which the reflectors associated with the interferometer arms are stationary, and scanning is accomplished by displacement of a single wedge-shaped refractive element in one of the arms. The reflectors are preferably retro-reflectors rather than flat mirrors in order to minimize the effects of chromatic dispersion. A Moire scale may be used to measure the position of the wedge-shaped refractive element.

REFERENCES:
patent: 3153111 (1964-10-01), Barber et al.
patent: 3661464 (1972-05-01), Hubbard
Kassel, private communication to Applicant, copies supplied by Applicant.
Beaudouin et al., "Optical Path Length Compensator," IBM Technical Disclosure Bulletin, vol. 13, No. 7, 12/70.
Ring et al., "Field Compensated Michelson Spectrometers," Applied Optics, vol. 11, No. 3, pp. 507-516, Mar. 1972.
Mertz, L., Transformations in Optics, Wiley & Sons, N.Y., pp. 16-20.

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