Refractively scanned interferometer

Details Refractively scanned interferometer Refractively scanned interferometer

1977-06-22

1979-08-28

Clark, Conrad J.

Optics: measuring and testing

By particle light scattering

With photocell detection

G01B 902

Patent

active

041659384

ABSTRACT:
An interferometer is disclosed, preferably of the Michelson type, in which the reflectors associated with the interferometer arms are stationary, and scanning is accomplished by motion of a wedge-shaped refractive element in one of the arms, the orientation of the refractive element and its direction of motion being in specific mathematically derived directions which minimize the translatory displacement of the transmitted optical beam.

REFERENCES:
patent: 2853917 (1958-09-01), Koulikovitch
patent: 3109049 (1963-10-01), Williams
patent: 3684379 (1972-08-01), Girard
Beaudouin, P. L., et al., "Optical Path Length Compensator", IBM Technical Disclosure Bulletin, vol. 13, No. 7, 12/70.
Mertz, L., Transformations in Optics, Wiley & Sons, N.Y., Jan. 1975, pp. 16-20.
Ring, J. et al., "Field Compensated Michelson Spectrometers", Applied Optics, vol. 11, No. 3, Mar. 1972.

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