Refractive index profiling technique

Details Refractive index profiling technique Refractive index profiling technique

1989-03-24

1990-06-19

Evans, F. L.

Optics: measuring and testing

For optical fiber or waveguide inspection

356128, G01N 2141

Patent

active

049348183

ABSTRACT:
A monochromatic light beam scans a silica reference and a translucent body, both submerged in index matching fluid and the deflection angle of the beam is measured as it exits the reference, the translucent body and the fluid. This deflection angle of the light beam exiting the reference is compared with the undeflected beam passing through only the fluid. The difference, if any, is used to offset the measurements of the deflection angles of the light beam exiting the translucent body to correct them so that the profile is referenced to the index of silica.

REFERENCES:
patent: 4227806 (1980-10-01), Watkins
patent: 4726677 (1988-02-01), Glantschnig et al.
Saekeang et al., Applied Optics, vol. 19, No. 12, Jun. 15, 1980, pp. 2025-2030.
Young, Applied Optics, vol. 19, No. 15, Aug. 1, 1980, pp. 2479 and 2480.

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