Refractive index measurement of optical thin-film

Details Refractive index measurement of optical thin-film Refractive index measurement of optical thin-film

1980-04-18

1982-06-22

McGraw, Vincent P.

Optics: measuring and testing

By polarized light examination

With birefringent element

356128, G01N 2145

Patent

active

043359612

ABSTRACT:
Method and apparatus for determining the refractive index of an optical film over a wide spectral range is described that involves measuring the changing radiant reflectance (or transmittance) of the film at various wavelengths as it is being deposited upon a substrate, as for example by vacuum deposition process. By determining the values of the extreme limits, an envelope of the peak reflectance can be developed from which the film's index of refraction is obtained over the entire spectral range that is situated between the two extreme wavelength channels.

REFERENCES:
patent: 3751643 (1973-08-01), Dill et al.
patent: 3892490 (1975-07-01), Uetsuki et al.
"The Determination of the Refractive Index and Thickness of Transparent Film"; Khawaja, J. Phys. D.: Appl. Phys., vol. 9, 1976, pp. 1939-1943.

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