Refraction index change measurement

Details Refraction index change measurement Refraction index change measurement

1992-11-20

1993-07-27

Willis, Davis L.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

356357, 356128, G01D 534, G01B 1102

Patent

active

052312852

ABSTRACT:
A method and apparatus for measuring the change in refractive index of a material with respect to temperature. The invention contemplates measuring the change in length of the material with respect to temperature over a predetermined temperature range with a Fizeau Interferometer by measuring the change in length through a vacuum at a point adjacent the length to produce a first set of data. Also measured is the change in the same length of the same material with respect to temperature over the same predetermined temperature range with the Interferometer by measuring the change in the length through the material to produce a second set of data. Determining the difference between the first and second sets of data produces resulting data which is the change in refractive index of the material with respect to temperature.

REFERENCES:
patent: 3930730 (1976-01-01), Laurens et al.
patent: 3950104 (1976-04-01), Munk
patent: 4425810 (1984-01-01), Simon et al.
patent: 4989980 (1991-02-01), Berg
patent: 5121987 (1992-06-01), Berg

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