Reformation techniques for capacitors of implantable medical...

Details Reformation techniques for capacitors of implantable medical... Reformation techniques for capacitors of implantable medical...

2007-05-01

2007-05-01

Getzow, Scott M. (Department: 3762)

Surgery: light, thermal, and electrical application

Light, thermal, and electrical application

Electrical therapeutic systems

Reexamination Certificate

active

10630002

ABSTRACT:
The invention is directed to techniques for estimating a deformation factor of one or more capacitors in an implantable medical devices (IMD), and techniques for reforming such capacitors. An estimate of the ideal charge time is extrapolated from a first measured charge interval associated with charging the capacitor(s) to a first energy level. The actual charge time to associated with charging the capacitor(s) to a second energy level, e.g., the fully charged state, is measured. The deformation factor is calculated as a ratio of the actual charge interval to the second energy level to the ideal charge time. In some cases, the calculated deformation factor is used to adjust the timing of a future scheduled reformation of the capacitor(s).

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