Reflector system for michelson interferometers

Details Reflector system for michelson interferometers Reflector system for michelson interferometers

1989-11-16

1991-11-19

Turner, Samuel

Optics: measuring and testing

By particle light scattering

With photocell detection

G01B 902

Patent

active

050669907

ABSTRACT:
A reflector system for Michelson interferometers comprises: a beam splitter arranged in the measurement ray path, which splits the measurement beam path into two split ray paths; a first mirror arrangement in each split ray path reflecting parallel to the incident ray; and at least one second mirror reflecting parallel to the incident ray, which is arranged in the ray path reflected from one of the first mirror arrangements and is coupled to the beam splitter, a partially transparent reflector serving as beam splitter, and the beam splitter and second mirror being arranged on a common carrier.

REFERENCES:
patent: 4773757 (1988-09-01), Doyle
patent: 4784490 (1988-11-01), Wayne
patent: 4810092 (1989-03-01), Auth
Burkert, Peter, F. Fergg, and H. Fischer, "A Compact High-Resolution Michelson Interferometer for Passive Atmospheric Sounding (MIPAS," IEEE Transactions on Geoscience and Remote Sensing, vol. GE-21 (1983), Jul., No. 3, New York, U.S.A. pp. 345-349.

Affiliated with

Also associated with

Rating

Reflector system for michelson interferometers does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Reflector system for michelson interferometers, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reflector system for michelson interferometers will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1373596