Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
2007-01-30
2009-06-16
Dole, Timothy J (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
C324S533000, C324S534000
Reexamination Certificate
active
07548071
ABSTRACT:
A technique for reflectometry testing of a signal path is disclosed. The technique includes injecting a test signal based on a probe pseudo-noise sequence into the signal path and obtaining a response signal. A sliding reference pseudo-noise sequence is correlated against the response signal. Both the probe sequence and the reference sequence are generated at a chip rate. The correlation is obtained for integer chip time delays, and sub-chip resolution of a peak correlation delay is estimated from at least two samples of the correlation.
REFERENCES:
patent: 4744083 (1988-05-01), O'Neill et al.
patent: 4789948 (1988-12-01), Von der Embse
patent: 5000568 (1991-03-01), Trutna, Jr. et al.
patent: 5731993 (1998-03-01), Wachs et al.
patent: 6144721 (2000-11-01), Stephens
patent: 6462705 (2002-10-01), McEwan
patent: 6509740 (2003-01-01), Needle et al.
patent: 6836517 (2004-12-01), Nagatani et al.
patent: 6842011 (2005-01-01), Page et al.
patent: 7165200 (2007-01-01), Jani et al.
patent: 7250772 (2007-07-01), Furse et al.
patent: 7375602 (2008-05-01), Flake et al.
patent: 2002/0161539 (2002-10-01), Jones et al.
patent: 2002/0161542 (2002-10-01), Jones et al.
patent: 2002/0169585 (2002-11-01), Jones et al.
patent: 2003/0185101 (2003-10-01), Wildey
patent: 2004/0019443 (2004-01-01), Jones et al.
patent: 2004/0039976 (2004-02-01), Gunther et al.
patent: WO 0225299 (2002-03-01), None
TaylorF. et al., “Digital simulation of fault location on EHV lines using wideband spread spectrum techniques,” Generation, Transmission and Distribution, IEE Proceeding, Jan. 1995, pp. 73-80, vol. 142, No. 1.
TaylorF. et al., “Line monitoring and fault location using spread spectrum on power line carrier” Generation, Transmission and Distribution, IEE Proceeding, Sep. 1996, pp. 427-434, vol. 143 No. 5.
Furse Cynthia
Harrison Reid
Sharma Chirag
Dole Timothy J
Kirton & McConkie
Ralston William T.
University of Utah Research Foundation
Zhu John
LandOfFree
Reflectometry test system using a sliding pseudo-noise... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Reflectometry test system using a sliding pseudo-noise..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reflectometry test system using a sliding pseudo-noise... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4071698