Reflectometry system with compensation for specimen holder...

Details Reflectometry system with compensation for specimen holder... Reflectometry system with compensation for specimen holder...

2006-04-18

2006-04-18

Choobin, Barry (Department: 2625)

Image analysis

Applications

Biomedical applications

C377S010000

Reexamination Certificate

active

07031508

ABSTRACT:
A self-contained system uses light reflectivity to examine intensity of a dyed spot on a device membrane surrounded by background area to discern information about the specimen that produced the spot. In a preferred embodiment, a master clock alternatively drives one LED focussed upon the spot center, and then drives two LEDS focused on the background area. Light reflected from the spot and background is detected by preferably two photodetectors (“PDs”) spaced-apart a multiple of 90° azimuthal.

REFERENCES:
patent: 4020151 (1977-04-01), Bolz et al.
patent: 4092068 (1978-05-01), Lucas et al.
patent: 4097845 (1978-06-01), Bacus
patent: 4335427 (1982-06-01), Hunt et al.
patent: 4338024 (1982-07-01), Bolz et al.
patent: 4404289 (1983-09-01), Masuda et al.
patent: 4447153 (1984-05-01), Cremers et al.
patent: 4476231 (1984-10-01), Deindoerfer et al.
patent: 4523853 (1985-06-01), Rosenbladt et al.
patent: 4537861 (1985-08-01), Elings et al.
patent: 4538227 (1985-08-01), Toraichi et al.
patent: 4552458 (1985-11-01), Lowne
patent: 4563701 (1986-01-01), Gilath et al.
patent: 4590582 (1986-05-01), Umemura
patent: 4611340 (1986-09-01), Okazaki
patent: 4647544 (1987-03-01), Nicoli et al.
patent: 4648053 (1987-03-01), Fridge
patent: 4667335 (1987-05-01), Deindoerfer
patent: 4674108 (1987-06-01), Asahina et al.
patent: 4676653 (1987-06-01), Strohmeier et al.
patent: 4689670 (1987-08-01), Okazaki
patent: 4737464 (1988-04-01), McConnell et al.
patent: 4755058 (1988-07-01), Shaffer
patent: 4769776 (1988-09-01), Hiraoka et al.
patent: 4817123 (1989-03-01), Sones et al.
patent: 4850029 (1989-07-01), Moyer et al.
patent: 4855930 (1989-08-01), Chao et al.
patent: 4875104 (1989-10-01), Kamon
patent: 4882492 (1989-11-01), Schlager
patent: 4884213 (1989-11-01), Iwata et al.
patent: 4891757 (1990-01-01), Shroy et al.
patent: 4922915 (1990-05-01), Arnold et al.
patent: 4983032 (1991-01-01), Van Den Brandt
patent: 5008185 (1991-04-01), Bacus
patent: 5014216 (1991-05-01), Stafford et al.
patent: 5018209 (1991-05-01), Bacus
patent: 5028139 (1991-07-01), Kramer et al.
patent: 5037614 (1991-08-01), Makita et al.
patent: 5039225 (1991-08-01), Uekusa
patent: 5046003 (1991-09-01), Crawford
patent: 5071248 (1991-12-01), Tiefenthaler et al.
patent: 5121338 (1992-06-01), Lodder
patent: 5151966 (1992-09-01), Brehm et al.
patent: 5159412 (1992-10-01), Willenborg et al.
patent: 5189495 (1993-02-01), Brunsting et al.
patent: 5218419 (1993-06-01), Lipson et al.
patent: 5231576 (1993-07-01), Suzuki et al.
patent: 5239696 (1993-08-01), Balch et al.
patent: 5279925 (1994-01-01), Berger et al.
patent: 5320814 (1994-06-01), Walt et al.
patent: 5321492 (1994-06-01), Detwiler et al.
patent: 5353799 (1994-10-01), Chance
patent: 5413939 (1995-05-01), Gustafson et al.
patent: 5437840 (1995-08-01), King et al.
patent: 5463467 (1995-10-01), Baumann et al.
patent: 5473706 (1995-12-01), Bacus et al.
patent: 5485527 (1996-01-01), Bacus et al.
patent: 5515170 (1996-05-01), Matzinger et al.
patent: 5518689 (1996-05-01), Dosmann et al.
patent: 5526258 (1996-06-01), Bacus
patent: 5537374 (1996-07-01), Wachi
patent: 5604105 (1997-02-01), Jackowski
patent: 5616502 (1997-04-01), Haugland et al.
patent: 5633724 (1997-05-01), King et al.
patent: 5642192 (1997-06-01), Gordon et al.
patent: 5654803 (1997-08-01), Howard, III et al.
patent: 5661563 (1997-08-01), Howard et al.
patent: 5706094 (1998-01-01), Maris
patent: 5717778 (1998-02-01), Chu et al.
patent: 5738997 (1998-04-01), Hayashi et al.
patent: 5781299 (1998-07-01), Womack et al.
patent: 5828776 (1998-10-01), Lee et al.
patent: 5831254 (1998-11-01), Karpen
patent: 6081325 (2000-06-01), Leslie et al.
patent: 6118516 (2000-09-01), Irie et al.
patent: 6172744 (2001-01-01), Scharlack et al.
patent: 6248988 (2001-06-01), Krantz
patent: 6515292 (2003-02-01), Scherer et al.
patent: 6584217 (2003-06-01), Lawless et al.
patent: 6586193 (2003-07-01), Yguerabide et al.
patent: 2002/0061178 (2002-05-01), Winston et al.
patent: 2002/0137091 (2002-09-01), Luttermann et al.
patent: 2003/0157731 (2003-08-01), Yguerabide et al.
patent: 2003/0171655 (2003-09-01), Newman et al.
patent: 2003/0207328 (2003-11-01), Yguerabide et al.
patent: 2004/0062028 (2004-04-01), Winston et al.
patent: 2004/0246606 (2004-12-01), Benitez et al.
patent: 2004/0252390 (2004-12-01), Benitez et al.
patent: 2005/0048599 (2005-03-01), Goldberg et al.
patent: 2005/0112784 (2005-05-01), Yguerabide et al.
patent: 2005/0185178 (2005-08-01), Gardner et al.
patent: 3720166 (1988-12-01), None
patent: 0 417 551 (1991-03-01), None
McGraw-Hill Encyclopedia of Science and Technology, 1997, 7thEdition, McGraw-Hill, Inc., New York, pp. 411-421.
McGraw-Hill Yearbook of Science and Technology, 1997, McGraw-Hill, New York.

Affiliated with

Also associated with

Rating

Reflectometry system with compensation for specimen holder... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Reflectometry system with compensation for specimen holder..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reflectometry system with compensation for specimen holder... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3562465