Reflectivity/emissivity measurement probe insensitive to...

Optics: measuring and testing – Of light reflection – By comparison

Reexamination Certificate

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Reexamination Certificate

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07742171

ABSTRACT:
Apparatuses and methods for accurately measuring the reflectivity of a target surface, under conditions where the distance between a measuring probe and the target surface is not fixed. At least two measurements of the target reflectivity are taken under different conditions, and then these two or more measurements are combined in order to calculate the target reflectivity in a way which is independent of the probe-to-target distance. In particular, the different conditions are such that each measurement samples radiation reflected from the target surface at a different distribution of angles. The apparatus can also be used to accurately measure the distance between the probe measurement head and a target surface.

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patent: 2005/0286053 (2005-12-01), Imura
patent: 2006/0268283 (2006-11-01), Zaldo Luezas et al.

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