Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1986-12-04
1988-09-13
LaRoche, Eugene R.
Optics: measuring and testing
By polarized light examination
With light attenuation
356446, G01N 2147
Patent
active
047705361
ABSTRACT:
A relative reflectivity photometry instrument is provided for measuring surface reflectance as a measure, for example, of surface roughness of a specimen. The instrument includes a housing or barrel having a source of light at one end and a pair of photosensors such as photodiodes at the other end, one of which is positioned to receive rays directly from the light source and the other of which is oriented in a different direction to receive light only after the rays from the light source have struck the specimen and are scattered back onto the second sensor. Typically, the light source is mounted at the top of a barrel with the photodiodes positioned at the lower end of the barrel. The photodiodes are provided with a central opening through which a portion of the bundle of rays passes onto the specimen and is thereafter reflected onto the photosensitive surface of the second diode. Circuitry is provided for amplifying and comparing the signals received the first and second photosensitive surfaces. The comparing circuit can comprise a divider circuit for establishing a ratio between the signals from the first and second photodiodes.
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Harmon James V.
LaRoche Eugene R.
Mis David
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