Optics: measuring and testing – With sample preparation
Patent
1981-09-11
1984-05-15
Punter, William H.
Optics: measuring and testing
With sample preparation
350 9612, 356244, 356318, 356432, G01N 128, G01N 2101, G02B 514
Patent
active
044485247
ABSTRACT:
Efficient transmission of light through a matrix isolation thin film is obtained despite the fact that the index configuration of the thin film is not appropriate for classical waveguides. The light is transmitted through the film approximately parallel to the substrate, thereby permitting analysis of the thin film, stimulation of reaction within the thin film, or use of the thin film as an optical memory.
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Y. Levy, C. Imbert, J. Cipriani, S. Racine and R. Dupeyrat, "Raman Scattering of Thin Films as a Waveguide", Optics Communications, vol. 11, No. 1, May 1974, pp. 66-69.
S. C. Rashleigh, "Positive-Permittivity-Metal Cladding: Its Effect on the Modes of Dielectric Optical Waveguides", Applied Optics, vol. 15, No. 11, Nov. 1976, pp. 2804-2811.
A. K. Mal'tsev, R. G. Mikaelyan and O. M. Nefedov, "A Cryostat for Studying Chemical Reactions by the Method of Matrix Confinement", Cryogenics, vol. 10, Apr. 1972, pp. 147-148.
Brus Louis E.
Rossetti Ronald
Bell Telephone Laboratories Incorporated
Nilsen Walter G.
Punter William H.
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