Radiant energy – Invisible radiant energy responsive electric signalling – Infrared responsive
Reexamination Certificate
2004-05-24
2009-02-10
Porta, David P (Department: 2884)
Radiant energy
Invisible radiant energy responsive electric signalling
Infrared responsive
Reexamination Certificate
active
07488940
ABSTRACT:
A reflection-type terahertz spectrometer includes an input optical path through which terahertz waves are propagated, an irradiating mechanism that irradiates a sample with terahertz waves propagated through the input optical path, an output optical path through which terahertz waves exiting from the irradiating mechanism are propagated, and a detector that receives and detects the terahertz waves propagated through the output optical path. The irradiating mechanism has at least one planar interface and a refractive index greater than that of a peripheral region contacting the planar interface and is disposed between the input optical path and the output optical path such that the terahertz waves propagated through the input optical path to be incident on the planar interface undergo total internal reflection at the planar interface, and the sample is disposed in the peripheral region contacting the planar interface of the irradiating mechanism. When the terahertz waves undergo the total internal reflection at the planar interface, the sample is irradiated with evanescent waves scattering from the planar interface to the peripheral region contacting the planar interface, so as to measure a spectrum.
REFERENCES:
patent: 4129781 (1978-12-01), Doyle
patent: 5532488 (1996-07-01), Ishibashi et al.
patent: 5534698 (1996-07-01), Ohshima et al.
patent: 5578828 (1996-11-01), Brown et al.
patent: 5789750 (1998-08-01), Nuss
patent: 5894127 (1999-04-01), Dando et al.
patent: 6301041 (2001-10-01), Yamada
patent: 7145148 (2006-12-01), Alfano et al.
patent: 7214940 (2007-05-01), Cluff et al.
patent: 2004/0065832 (2004-04-01), Cluff et al.
patent: 2005/0179905 (2005-08-01), Ohtake et al.
patent: 1 079 225 (2001-02-01), None
patent: 2371111 (2002-07-01), None
patent: 2384555 (2003-07-01), None
patent: 2396695 (2004-06-01), None
patent: 05-072119 (1993-03-01), None
patent: 7-103890 (1995-04-01), None
patent: 08-201272 (1996-08-01), None
patent: 9-68495 (1997-03-01), None
patent: 9-292339 (1997-11-01), None
patent: 2000-146836 (2000-05-01), None
patent: 2000146836 (2000-05-01), None
patent: 2003-14620 (2003-01-01), None
patent: WO 02/057750 (2002-07-01), None
patent: WO02/057750 (2002-07-01), None
G. Torosyan, et al., “Application of Narrowband Tunabel THz-Radiation for Biomedical Sensing”, Proceedings of the Second Joint EMBS/MES Conference, vol. 3, Oct. 2002, pp. 2335-2336.
Koichiro Tanaka, “Jikan Ryoiki Tera Hertz Zenhansha Gensui Bunkoho”, Oyo Butsurigaku Kankei Rengo Koenkai Koen Yokoshu, vol. 51st, No. 0, Mar. 2004, p. 31.
Koichiro Tanaka, “Jikan Ryoiki Tera Hertz Zenhansha Gensui Bunko Sochi no Kochiku to sono Hyoka”, Extended Abstract; the Japan Society of Applied Physics, vol. 64th, No. 3, 2003, p. 1000.
Ryo Karasawa et al., “Kinsetsujo o Mochiita Tera Hertz Imaging System”, Oyo Butsurigaku Kankei Rengo Koenkai Koen Yokoshu, vol. 49th, No. 3, Mar. 2002, p. 1102.
Kiyomi Sakai et al., “Terahertz Time Domain Spectroscopy and Imaging”, Laser Review, vol. 30, No. 7, Jul. 2002, pp. 376-384.
Offermann, V. et al., “Experimental aspects of attenuated total reflectance spectroscopy in the infrared”, Vibrational Spectroscopy, vol. 8, pp. 135-140, 1995.
Tetsuhiko Ohba, et al., “Far-Infrared Optical Constants of Liquid Acetonitrile as Measured by a Laser Attenuated Total Reflection Method”, Chemical Physics Letters, XP-002411518, vol. 117, No. 5, Jun. 28, 1985, pp. 397-399.
D. E. Brown, et al., “A high-resolution Fourier transform spectrometer for far infrared magneto-optic spectroscopy of magnetic materials”, Infrared Physics & Technology, XP-002411519, vol. 40, No. 3, 1999, pp. 219-230.
A. Hartstein, et al., “Investigation of optic-phonon-magnetoplasmon-type surface polaritons onn-InSb”, Physical Review B, XP-002411520, vol. 12, No. 8, Oct. 15, 1975, pp. 3186-3199.
Neil Everall, et al., “Characterisation of biaxial orientation gradients in poly(ethylene terephthalate) films and bottles using polarised attenuated total reflection FTIR spectroscopy”, Polymer, XP-004354970, vol. 43, No. 15, 2002, pp. 4217-4223.
Lynn L. Deibler, et al., “Infrared Polarimetry Using Attenuated Total Reflection”, Proceedings of the SPIE, XP 008001654, vol. 3754, Jul. 1999, pp. 99-107.
S. Ikawa, et al., “Measurement of Far-Infrared Optical Constants By ATR High Rep Rate High Performance Plasma Focus as a Powerful Radiationsource”, International Journal of Infrared and Millimeter Waves, vol. 6, No. 4, XP-001248762, 1985, pp. 287-306.
A. R. El-Gohary, et al., “Observation of surface phonon-polaritons on a MQW specimen by attenuated-total-reflection spectroscopy”, Semiconductor Science and Technology, vol. 4, No. 5, XP-020031980, May 1, 1989, pp. 388-392.
T. Dumelow, et al., “Far-IR Spectroscopy of Bulk and Surface Phonon-Polaritons on Epitaxial Layers of CdTe Deposited by Plasma MOCVD on GaAs Substrates”, Materials Science and Engineering, vol. B5, No. 2, XP-002422081, Jan. 1990, pp. 217-221.
N. Raj, et al., “Theory of far-infrared attenuated total reflection from semiconductor superlattices”, Journal of Physics C: Solid State Physics, vol. 20, No. 31, XP-020010485, Nov. 10, 1987, pp. 5203-5216.
A. Hatta, et al., “Electronic absorption enhancement for TCNQ films on silver by excitation of surface plasmon polaritons”, Applied Surface Science, vol. 51, No. 3/4, XP-000863744, 1991, pp. 193-200.
A. Hatta, et al., “Polarization-Modulation Electronic Absortion Study of Copper Phthalocyanine Films on Silver by Surface Plasmon Resonance Spectroscopy”, Applied Surface Science, vol. 40, No. 1-2, XP-002422082, Nov. 1989, pp. 9-18.
E. Hutter, et al., “Fourier Transform Infrared Spectroscopy Using Polarization Modulation and Polarization Selective Techniques for Internal and External Reflection Geometries: Investigation of Self-Assembled Octadecylmercaptan on a Thin Gold Film”, J. Phys. Chem., vol. 107, No. 31, XP-002422083, Apr. 7, 2003, pp. 7812-7819.
Erik Goormaghtigh, et al., “Attenuated total reflection infrared spectroscopy of proteins and lipids in biological membranes”, Biochimica et Biophysica Acta, vol. 1422, No. 2, XP-004281745, Jul. 6, 1999, pp. 105-185.
Petra Heinrich, et al., “Determination of Organic Compounds By IR/ATR Spectroscopy with Polymer-Coated Internal Reflection Elements”, Applied Spectroscopy, vol. 44, No. 10, XP-000169320, Dec. 1, 1990, pp. 1641-1646.
P. Y. Han, et al., “A direct comparison between terahertz time-domain spectroscopy and far-infrared fourier transform spectroscopy”, Journal of Applied Physics, vol. 89, No. 4, XP-012052979, Feb. 15, 2001, pp. 2357-2359.
Nagai Masaya
Ohtake Hideyuki
Tanaka Koichiro
Yoshida Makoto
Aisin Seiki Kabushiki Kaisha
Baker David S
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Porta David P
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