Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1997-01-21
1998-06-30
Nelms, David C.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
250237G, G01B 902
Patent
active
057742197
ABSTRACT:
A reflection-type main scale G1 is disposed on a first member 10. A diffused light source 40, a transmission-type light source index scale G2, and a photodiode array PDA are disposed on a second member 20. The diffused light source 40 irradiates the main scale G1 through the index scale G2 for generating a reflected image pattern. The photodiode array PDA detects the reflected image pattern obtained from the main scale G1. The photodiode array PDA and the index scale G2 are integrally united in such a manner that the receiving surface of the photodiode array PDA and the grating surface of the index scale G2 are aligned in a plane.
REFERENCES:
patent: 4051367 (1977-09-01), Sayce et al.
patent: 5067816 (1991-11-01), Ichikawa
patent: 5657125 (1997-08-01), Kato et al.
Kim Robert
Mitutoyo Corporation
Nelms David C.
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