Reflection time-of-flight mass spectrometer

Details Reflection time-of-flight mass spectrometer Reflection time-of-flight mass spectrometer

1997-06-26

1999-09-21

Nguyen, Kiet T.

Radiant energy

Ionic separation or analysis

Ion beam pulsing means with detector synchronizing means

H01J 4940

Patent

active

059557303

ABSTRACT:
An improved reflectron time-of-flight mass spectrometer having improved design features in both the ion source and the ion reflection region. The ion source employs a near-ground voltage configuration and second-order spatial focusing of generated ions. The ion mirror is a new two-stage, second-order-corrected, energy-focusing, gridless design. The near-ground voltage configuration of the source, the second-order spatial focusing design of the source, and the new ion mirror serve to yield superior mass resolution, superior sensitivity, and superior safety, utility, and operational characteristics.

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