Reflection measurement method and apparatus for devices that...

Details Reflection measurement method and apparatus for devices that... Reflection measurement method and apparatus for devices that...

2001-03-19

2002-11-26

Le, N. (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S535000

Reexamination Certificate

active

06486676

ABSTRACT:

BACKGROUND AND SUMMARY OF THE INVENTION
Time domain reflectometry and frequency domain network analysis are traditional techniques used to measure reflection characteristics of a device under test (DUT). There is a need to adapt these techniques to measure reflection characteristics of a DUT when access to the DUT is through a dispersive element. This need is met by a reflection measurement method and apparatus constructed according to the embodiments of the present invention.


REFERENCES:
patent: 5305239 (1994-04-01), Kinra
patent: 5371505 (1994-12-01), Michaels
patent: 6134003 (2000-10-01), Tearney et al.
patent: 6343510 (2002-02-01), Neeson et al.

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