Optical: systems and elements – Light interference – Produced by coating or lamina
Reexamination Certificate
2007-01-30
2007-01-30
Assaf, Fayez G. (Department: 2872)
Optical: systems and elements
Light interference
Produced by coating or lamina
C359S587000, C359S590000
Reexamination Certificate
active
10510725
ABSTRACT:
A reflector for extreme ultraviolet light, its manufacture method, a phase shift mask, an exposure apparatus and a semiconductor manufacture method, capable of making the wavelength dependency of a reflectance via a plurality of reflection surfaces be coincident with an center wavelength of exposure light and retaining a sufficient energy reaching a subject to be exposed. The reflector for exposure light to be used for exposure of a subject to be exposed in a lithography process of manufacturing a semiconductor device is configured to have a multi-layer film structure made by repetitively stacking a plurality of layers in the same order. The periodical length of the repetitive stack unit of the multi-layer film structure is set in such a manner that the center of full width at half maximum of the reflectance via a predetermined number of reflectors becomes coincident with the center wavelength of extreme ultraviolet light to be reflected (S102).
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Communication from European Patent Office of Application No. 03 723 149.5-1234 dated Sep. 28, 2006.
Assaf Fayez G.
Kananen Ronald P.
Rader & Fishman & Grauer, PLLC
Sony Corporation
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