Reflection density measuring system

Optics: measuring and testing – Of light reflection – With diffusion

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356430, G01N 2147

Patent

active

048231690

ABSTRACT:
A reflection density measuring system comprises a light source for projecting an irradiation light onto the surface-to-be-measured of a sample and a photodetector which has a photosensor for detecting light reflected by the surface-to-be-measured of the sample to impinge upon the photosensor through a light receiving surface of the photodetector. The distance r between the center of the light receiving surface of the photodetector and the optical axis of the irradiation light is r.sub.o, the distance h between the center of the light receiving surface and the surface-to-be-measured as measured along the optical axis of the irradiation light is h.sub.o, and the angle .theta. which the light receiving surface forms with the surface-to-be-measured is .theta.o, h.sub.o being the value of h at which output I of the photosensor takes a peak value on an output curve representing the change of the output I of the photosensor with the distance h when the distance h is varied under the combination of r.sub.o and .theta.o.

REFERENCES:
patent: 3578977 (1971-05-01), Natelson
patent: 4037970 (1977-07-01), Webster et al.
patent: 4252443 (1981-02-01), Lucas et al.
patent: 4568191 (1986-02-01), Barry
patent: 4616933 (1986-10-01), Leveque et al.

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