Reflection densitometer with ellipsoid reflection surface

Details Reflection densitometer with ellipsoid reflection surface Reflection densitometer with ellipsoid reflection surface

1981-04-14

1984-10-30

Arnold, Bruce Y.

Optics: measuring and testing

Of light reflection

G01N 2155

Patent

active

044797141

ABSTRACT:
A reflection densitometer includes an optical assembly formed with an ellipsoidal internal reflecting surface receiving light from a specimen at a target region located at one focus of the ellipsoidal surface and directing light to a photodetector at the other focus. A light source is mounted concentrically within the ellipsoidal surface, coaxially with the target and photodetector.

REFERENCES:
patent: 1897219 (1933-02-01), Schroter
patent: 3010358 (1961-11-01), Siegler, Jr.
patent: 4082458 (1978-04-01), Fukui et al.

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