Optics: measuring and testing – Of light reflection
Patent
1990-02-06
1992-12-22
McGraw, Vincent P.
Optics: measuring and testing
Of light reflection
250214B, 307311, G01N 2155
Patent
active
051737507
ABSTRACT:
A reflection densitometer includes a light source and a photodetector having an output which has a signal component characteristic of the amount of reflected light received from a surface to be measured and a noise component. The noise component of the output is isolated in time by switching the light source on and off so as to create alternating first and second time periods during which the output of the photodetector is characteristic of only the noise component and in which the output of the photodetector is characteristic of both the signal component plus the noise component, respectively. The output of the photodetector during the second time period is subtracted from the output during the first time period to obtain a signal characteristic of only the output of the photodetector characteristic of relected light received. The signal is held constant during the first and second periods by a sample and hold circuit adapted to sample the signal during the second periods and to hold the sampled signal during the first periods.
REFERENCES:
patent: 4553033 (1985-10-01), Hubble, III et al.
patent: 4851689 (1989-07-01), Hasegawa
Eastman Kodak Company
Howley David A.
Keesee, II LaCharles P.
McGraw Vincent P.
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