Reflection characteristic measuring apparatus

Details Reflection characteristic measuring apparatus Reflection characteristic measuring apparatus

1998-08-27

2000-07-11

Font, Frank G.

Optics: measuring and testing

Of light reflection

356236, 250228, G01J 142

Patent

active

060881178

ABSTRACT:
A reflection characteristic of a sample is measured using an integrating sphere by: measuring an apparent reflectance of a reference sample by using integrating sphere, the reference sample having a known true reflectance under a given illumination condition; calculating coefficients for rendering a linear combination of a measured apparent reflectance of the reference sample and N-th power (N is 2 or more integer) of the measured apparent reflectance closer to the known true reflectance of the reference sample; storing calculated coefficients in a storage medium as coefficients for the given illumination condition; measuring an apparent reflectance of a desired sample by using the integrating sphere; calculating a true reflectance of the desired sample under the given illumination condition by multiplying the terms of the linear combination of an measured apparent reflectance of the desired sample and N-th power of the measured apparent reflectance of the desired sample by the coefficients stored in the storage medium, respectively.

REFERENCES:
patent: 5045704 (1991-09-01), Coates
patent: 5384641 (1995-01-01), Imura
patent: 5859709 (1999-01-01), Imura

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