Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Patent
1988-03-31
1990-01-23
Strecker, Gerard R.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
324637, G01N 2200
Patent
active
048960969
ABSTRACT:
A reflected signal sampler for use in a network analyzer having a pair of diodes for sampling a signal reflected from a device under test (DUT). An amplitude detector for detecting the amplitude of a signal transmitted through the DUT. A reverse bias circuit responsive to the amplitude detector for applying a reverse bias to the diodes when the amplitude of the signal transmitted through the DUT falls below a predetermined magnitude, e.g. -60 db.
REFERENCES:
patent: 4758775 (1988-07-01), Roos
patent: 4769598 (1988-09-01), Potter et al.
Yamaguchi et al., "Design Considerations and Performance Evaluation of a Novel V-Band Network Analyzer/Reflection Test Unit," Conference on Precision Electromagnetic Measurements, (7/86), pp. 124-127.
Cronson et al., "A Six Port Automatic Network Analyzer," IEEE Transactions on Microwave Theory and Techniques, vol. MTT-25, No. 12 (12/77), pp. 1086-1091.
Crandell et al., "Reflectometers for Millimeter-Wave Measurements," Microwave Journal, vol. 23, No. 6, (6/80), pp. 59-60, 63.
Mueller Robert W.
Strecker Gerard R.
Wiltron Company
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