Reflectance method to determine and control the temperature of t

Details Reflectance method to determine and control the temperature of t Reflectance method to determine and control the temperature of t

1990-08-06

1992-03-24

Cuchlinski, Jr., William A.

Thermal measuring and testing

Temperature measurement

In spaced noncontact relationship to specimen

374123, 374161, G01K 1100, G01J 500

Patent

active

050981994

ABSTRACT:
A method of accurately determining the temperature of a thin layer of bandgap material without requiring contact to the layer involves the use of optical radiation reflected off the bandgap material and the detection of the reflected energy. The relationship between the temperature varying bandgap energy and the resulting reflection characteristics provides an indication of temperature, independent of ambient temperature.

REFERENCES:
patent: 3672221 (1972-06-01), Weil
patent: 4302970 (1981-12-01), Snitzer et al.
patent: 4539473 (1985-09-01), Brog.ang.rdh et al.
patent: 4671651 (1987-06-01), Toyoda et al.
patent: 4708677 (1987-11-01), Blank et al.
patent: 4799788 (1989-01-01), Berthet et al.
patent: 4890933 (1990-01-01), Amith

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