Reference voltage generating device, semiconductor...

Details Reference voltage generating device, semiconductor... Reference voltage generating device, semiconductor...

2005-02-01

2005-02-01

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S701000

Reexamination Certificate

active

06850085

ABSTRACT:
A testing device for a semiconductor integrated circuit of the present invention includes a differential amplifier array module and tester which determine whether an output voltage of a liquid crystal driver LSI is at a proper level and an expected value voltage generator which generates an expected value voltage in accordance with expected value data to output it to the differential amplifier array module. The expected value voltage generator produces expected value data by interpolation in accordance with incoming expected value data fewer in number than the expected value voltage to be generated, so as to be equal in number to the expected value voltage. This makes it possible to carry out an extremely short time and highly accurate test for output voltages of a device under test (liquid crystal driver LSI).

REFERENCES:
patent: 6677923 (2004-01-01), Kajihara et al.
patent: 6766266 (2004-07-01), Sakaguchi

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