Reference standard and method for calibration

Details Reference standard and method for calibration Reference standard and method for calibration

2006-06-06

2006-06-06

Porta, David (Department: 2884)

Radiant energy

Calibration or standardization methods

C378S207000

Reexamination Certificate

active

07057164

ABSTRACT:
The present invention provides a reference standard for calibration of an analysis instrument. The reference standard comprises a solid body formed of a number of compounds and a substrate having scattering properties similar to a product to be analyzed with said analysis instrument and being spectrally neutral in a wavelength range to be used in the analysis instrument. The substrate and the compounds in combination with respect to intensity, wavelength and scattering properties imitate the spectral response of the product to be analyzed with said analysis instrument. The present invention also provides a method for calibration of an analysis instrument, which method comprises recording, by means of said analysis instrument, the spectral response of a reference standard comprising a solid body, which with respect to intensity, wavelength and scattering properties imitates the spectral response of a product to be analyzed with said analysis instrument; evaluating the differences between the response from said analysis instrument and an expected spectral response; and calibrating said analysis instrument according to the result of the evaluation.

REFERENCES:
patent: 3478210 (1969-11-01), Janacek
patent: 4184768 (1980-01-01), Murphy et al.
patent: 4465929 (1984-08-01), Edgar
patent: 4761552 (1988-08-01), Rosenthal
patent: 4866644 (1989-09-01), Shenk et al.
patent: 5534698 (1996-07-01), Ohshima et al.
patent: 5637505 (1997-06-01), Li et al.
patent: 5689110 (1997-11-01), Dietz et al.
patent: 5892229 (1999-04-01), Crozier et al.
patent: 5933792 (1999-08-01), Andersen et al.
patent: 5936727 (1999-08-01), Trygstad
patent: 6358860 (2002-03-01), Scheer et al.
patent: 6470279 (2002-10-01), Samsoondar
patent: 6471916 (2002-10-01), Noblett
patent: 6956203 (2005-10-01), Staton et al.
patent: 2004/0084612 (2004-05-01), Staton et al.
patent: 0 368 436 (1990-05-01), None
patent: 0 906 936 (1999-04-01), None
patent: 0 959 353 (1999-11-01), None
I. Yasunobu;Patent Abstracts of Japan;“Phantom for Optical Scanning Device”; Publication No. 03-146850; 1991.

Affiliated with

Also associated with

Rating

Reference standard and method for calibration does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Reference standard and method for calibration, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reference standard and method for calibration will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3700874