Patent
1991-07-31
1993-12-28
Knepper, David D.
G10L 506
Patent
active
052747379
ABSTRACT:
In a reference pattern adapting device for adapting reference pattern parameter groups (1-M) to adapted reference pattern parameter groups (1-M) by using training patterns (1-L) derived from a training pattern signal (TP). A similarity calculating unit (15) calculates a group of primary degrees of similarity between (a) each of M reference pattern element groups representative of reference patterns (output of a vector group memory 11) and (b) each of M reference pattern parameter groups (output of pattern parameter memory 12). A difference calculating unit (16) calculates a group of differences between reference pattern elements of each of the M reference pattern element groups and training pattern elements of each of L training pattern element groups representative of the training patterns (1-L). A first calculating unit (21) calculates a primary difference value by using the group of primary degrees of similarity and the group of differences. A second calculating unit (22) calculates a group of primary mean values by using each of L reference pattern parameter groups and the group of differences. The resulting group of primary mean values is output to an identifier (25) as one of L adapted pattern parameter groups.
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Knepper David D.
NEC Corporation
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