Reference mark identification system for measuring instrument

Details Reference mark identification system for measuring instrument Reference mark identification system for measuring instrument

1984-02-29

1987-03-31

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

33125C, H01J 314

Patent

active

046545271

ABSTRACT:
A measuring system is described which includes a scale which defines a measuring graduation and an array of reference marks. The reference marks are positioned at predetermined absolute positions with respect to the graduation and are used to generate reproduceable electric reference control pulses. In order to identify each of the reference marks a serially allocated code mark is provided which is made up of at least one nonzero code mark segment. Each nonzero code mark segment agrees in spatial pattern with the nonzero associated reference mark in the measuring direction. In order to distinguish nonzero code mark segments from reference marks, the width of the nonzero code mark segments perpendicular to the measuring direction is made less than the width of the reference marks.

REFERENCES:
patent: 4403859 (1983-09-01), Ernst
patent: 4491928 (1985-01-01), Reichl
patent: 4492861 (1985-01-01), Kebschull et al.
patent: 4519140 (1985-05-01), Schmitt

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