Reference layer openings

Electricity: electrical systems and devices – Housing or mounting assemblies with diverse electrical... – For electronic systems and devices

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C361S794000, C174S262000, C174S264000, C174S265000, C174S258000, C174S260000, C174S250000

Reexamination Certificate

active

10864958

ABSTRACT:
A component having reference layer openings to contribute towards achieving a differential impedance in a circuit, is described herein.

REFERENCES:
patent: 5418690 (1995-05-01), Conn et al.
patent: 6084779 (2000-07-01), Fang
patent: 6143990 (2000-11-01), Kuramochi et al.
patent: 6191472 (2001-02-01), Mazumder
patent: 6469256 (2002-10-01), Miller et al.
patent: 6570102 (2003-05-01), Miller et al.
patent: 6707685 (2004-03-01), Kabumoto et al.
patent: 6828514 (2004-12-01), Chan et al.
patent: 6891731 (2005-05-01), Herrell
patent: 2003/0107056 (2003-06-01), Chin et al.
patent: 2006/0237222 (2006-10-01), Hosomi et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Reference layer openings does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Reference layer openings, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reference layer openings will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3873603

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.