Reference input patterns for evaluation and alignment of an opti

Details Reference input patterns for evaluation and alignment of an opti Reference input patterns for evaluation and alignment of an opti

1988-03-03

1990-01-09

McGraw, Vincent P.

Optics: measuring and testing

By alignment in lateral direction

With light detector

356153, 350 382, 35016213, 382 31, G01B 1127

Patent

active

048924083

ABSTRACT:
Reference patterns are disclosed which are designed particularly for the functions of evaluation and alignment of an optical instrument, such as a spectrum analyzer or an optical correlator employing a matched filter array as its memory. A preferred embodiment of the reference input pattern is binary and of simple geometry such that it can be easily fabricated and the Fourier transform and autocorrelation functions can be easily calculated. Two-dimensional spectral features and autocorrelation patterns for one particular input function have been derived in closed form and numerically evaluated. The Figures herein illustrate the symmetries in the multi-peaked distributions. Tables of relative intensities are disclosed and are useful in evaluating and comparing the performance of different coherent optical processing systems.

REFERENCES:
patent: 3539260 (1970-11-01), Burch

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