Reference-free direct digital lock-in method and apparatus

Details Reference-free direct digital lock-in method and apparatus Reference-free direct digital lock-in method and apparatus

1997-05-20

2000-01-04

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 31302

Patent

active

060114010

ABSTRACT:
A reference-free direct digital lock-in system (RDDL 10) has a first input coupled to a periodic electrical signal and an output for outputting an indication of a magnitude of a desired periodic signal component. The RDDL also has a second input for receiving a signal (9) that specifies a reference period value, and operates to autonomously generate a lock-in reference signal having a specified period and a phase that is adjusted to maximize a magnitude of the outputted desired periodic signal component. In an embodiment of a measurement system that includes the RDDL 10 an optical source provides a chopped light beam having wavelengths within a predetermined range of wavelengths, and the periodic electrical signal is generated by at least one photodetector that is illuminated by the chopped light beam. In this embodiment the measurement system characterizes, for at least one wavelength of light that is generated by the optical source, a spectral response of the at least one photodetector. The RDDL can operate in nonreal-time upon previously generated and stored digital equivalent values of the periodic electrical signal or signals.

REFERENCES:
patent: 4950897 (1990-08-01), Mandelis et al.
patent: 5063301 (1991-11-01), Turkevich et al.
patent: 5499190 (1996-03-01), Takahashi et al.

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