Registers – Records – Particular code pattern
Reexamination Certificate
2006-06-27
2006-06-27
Lee, Michael G. (Department: 2876)
Registers
Records
Particular code pattern
C235S456000, C235S487000, C235S462090
Reexamination Certificate
active
07066395
ABSTRACT:
In order to reduce a two-dimensional data structure to a minimum number of bits, a two-dimensional surface pattern is provided, which can be used in particular for identifying an absolute position on the surface and which has a pattern which comprises a SYNC pattern, which is used for synchronization, and a position-dependent code PC(x, y), with the SYNC pattern being variable and being formed in accordance with an already known formation rule.
REFERENCES:
patent: 5329107 (1994-07-01), Priddy et al.
patent: 5343031 (1994-08-01), Yoshida
patent: 5591956 (1997-01-01), Longacre et al.
patent: 6296192 (2001-10-01), Hecht
patent: 6330976 (2001-12-01), Dymetman et al.
Boitsov Sergej Valentinovitch
Ihlefeld Joachim
Kolesnik Vjatcheslav Aleksejevitch
Baumer Optronic GmbH
Lee Michael G.
Lee Seung H
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