Static information storage and retrieval – Floating gate – Particular connection
Reexamination Certificate
2007-06-26
2007-06-26
Hur, J. H. (Department: 2824)
Static information storage and retrieval
Floating gate
Particular connection
C365S200000, C365S189050, C365S185170, C365S049130
Reexamination Certificate
active
11010515
ABSTRACT:
A redundancy circuit for a NAND flash memory device reduces a test time and production time of the device, by performing a redundancy operation through a repair select unit using a cam cell. In addition, the redundancy circuit employs a repair method using a redundancy cam which can perform the repair operation much faster than a general repair method using fuse cutting.
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Office action for Korean patent application No. 2004-33199 filed May 11, 2004.
Hur J. H.
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
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