Reduction of sparkle noise and mottling in CCD imagers

Details Reduction of sparkle noise and mottling in CCD imagers Reduction of sparkle noise and mottling in CCD imagers

1979-05-02

1980-09-16

Munson, Gene M.

Electrical transmission or interconnection systems

Nonlinear reactor systems

Parametrons

357 24, 357 30, 357 59, 307362, G11C 1928, H01L 2978, H01L 2714, H01L 2904

Patent

active

042232341

ABSTRACT:
In a CCD imager of the single-layer electrode type wherein the gate electrodes are of one conductivity and the "gaps" between electrodes are of opposite conductivity type, sparkle and mottling are reduced by controlling the conductivity of the gaps. Such control is achieved by employing an overlying control electrode which is insulated from the gaps and gate electrodes, to which an adjustable control voltage is applied. The latter can be derived in open-loop fashion; however, in a preferred form of the invention, the leakage current between a pair of adjacent electrodes is sensed and employed to control a voltage which is fed back to the control electrode.

REFERENCES:
patent: 3931945 (1976-01-01), Levine
patent: 3943545 (1976-03-01), Kim
patent: 4009333 (1977-02-01), Berger et al.
patent: 4132903 (1979-01-01), Graham
Rodgers "A 512.times.320 Element Silicon Imaging Device", IEEE Int. Solid-State Circuits Conf. (2/75), Dig. Tech. Papers, pp. 118-189.

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