Reduction of positional errors in a four point probe...

Details Reduction of positional errors in a four point probe... Reduction of positional errors in a four point probe...

2005-09-13

2005-09-13

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S715000

Reexamination Certificate

active

06943571

ABSTRACT:
A system and method for measuring a resistance or a resistance per square, Rsq, of a material having a surface using a multi-point probe including four or more collinear contact points placed in the interior of the sample, the method including: making a first measurement using a first set of probe electrodes for inducing a current and a second set of probe electrodes for measuring the voltage difference when the current is induced; making a second measurement using a set of probe electrodes different from the first set for inducing a current and a set of probe electrodes different from the second set for measuring the voltage difference when the current is induced; and using a known relationship among the currents induced, the voltages measured, the nominal probe positions and the resistance per square to determine the resistance per square such that measurement errors resulting from positioning of the probes are reduced.

REFERENCES:
patent: 4703252 (1987-10-01), Perloff et al.
patent: 5691648 (1997-11-01), Cheng
patent: 6747445 (2004-06-01), Fetterman et al.

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