Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – With decomposition of a precursor
Reexamination Certificate
2007-09-27
2009-06-16
Hiteshew, Felisa C (Department: 1792)
Single-crystal, oriented-crystal, and epitaxy growth processes;
Forming from vapor or gaseous state
With decomposition of a precursor
C117S084000, C117S088000, C117S089000, C117S092000
Reexamination Certificate
active
07547360
ABSTRACT:
In a method of SiC single crystal growth, a SiC single crystal seed and polycrystalline SiC source material are provided in spaced relation inside of a graphite growth crucible along with at least one compound capable of forming SiO gas in the growth crucible. The growth crucible is heated whereupon the gaseous SiO forms and reacts with carbon in the growth crucible thereby avoiding the introduction of carbon into the SiC single crystal before and during the growth thereof and the SiC source material vaporizes and is transported via a temperature gradient in the growth crucible to the seed crystal where it precipitates and forms a SiC single crystal.
REFERENCES:
patent: 6406539 (2002-06-01), Shigeto et al.
Gupta Avinash K.
Semenas Edward
Zwieback Ilya
Hiteshew Felisa C
II-VI Incorporated
The Webb Law Firm
LandOfFree
Reduction of carbon inclusions in sublimation grown SiC... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Reduction of carbon inclusions in sublimation grown SiC..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Reduction of carbon inclusions in sublimation grown SiC... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4100677