Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-11-22
2005-11-22
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S095000, C455S315000
Reexamination Certificate
active
06968278
ABSTRACT:
The occurrence of spurs when analyzing signals is reduced. A first signal is mixed with a local oscillator signal to produce an intermediate signal. When a spur is predicted to occur when high side mixing is performed, low side mixing is performed. When a spur is predicted to occur when low side mixing is performed, high side mixing is performed.
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patent: 6373344 (2002-04-01), Mar
Christensen, III Paul G.
Dunsmore Joel P.
Jensen Niels
Marzalek Michael Stanley
Stark Donald W.
Agilent Technologie,s Inc.
Bui Bryan
Le John
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