Reducing the occurrence of spurs when analyzing signals

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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C324S095000, C455S315000

Reexamination Certificate

active

06968278

ABSTRACT:
The occurrence of spurs when analyzing signals is reduced. A first signal is mixed with a local oscillator signal to produce an intermediate signal. When a spur is predicted to occur when high side mixing is performed, low side mixing is performed. When a spur is predicted to occur when low side mixing is performed, high side mixing is performed.

REFERENCES:
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patent: 5493210 (1996-02-01), Orndorff et al.
patent: 5633582 (1997-05-01), Orndorff et al.
patent: 5640697 (1997-06-01), Orndorff
patent: 6373344 (2002-04-01), Mar

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