Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate
2008-03-14
2011-11-22
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Physical design processing
C716S106000, C716S111000, C716S116000, C716S117000, C716S136000
Reexamination Certificate
active
08065644
ABSTRACT:
A computer-implemented method of reducing susceptibility of a circuit design to single event upsets can include determining a susceptibility level of the circuit design to single event upsets, comparing the susceptibility level with a target susceptibility, and selectively applying a mitigation technique to at least one of a plurality of regions of the circuit design when the susceptibility level of the circuit design exceeds the target susceptibility. The circuit design including the mitigated region can be output.
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Corbett John D.
Jacobson Neil G.
Cartier Lois D.
Cuenot Kevin T.
Do Thuan
Nguyen Nha
Xilinx , Inc.
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