Coded data generation or conversion – Converter calibration or testing
Reexamination Certificate
2006-08-08
2006-08-08
Nguyen, Linh (Department: 2819)
Coded data generation or conversion
Converter calibration or testing
C341S172000
Reexamination Certificate
active
07088273
ABSTRACT:
A switched capacitor environment in which a feedback capacitor of a stage is flipped to be used as a sampling capacitor of the next stage. Due to such use of the feedback capacitor, the noise introduced by the stages is substantially reduced. Such switched capacitors can be used in analog to digital converters (ADC).
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patent: 7009549 (2006-03-01), Corsi
Ayyagari Ravishankar S.
Pentakota Visvesvaraya A.
Perdoor Sandeep Mallya
Brady III W. James
Nguyen Linh
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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